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TC74LVX00F/FN/FT
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC74LVX00F,TC74LVX00FN,TC74LVX00FT
Quad 2-Input NAND Gate
The TC74LVX00F/FN/FT is a high-speed CMOS 2-input NAND gate fabricated with silicon gate CMOS technology. Designed for use in 3-V systems, it achieves high-speed operation while maintaining the CMOS low power dissipation. This device is suitable for low-voltage and battery operated systems. The internal circuit is composed of 3 stages including buffer output, which provide high noise immunity and stable output. An input protection circuit ensures that 0 to 5.5V can be applied to the input pins without regard to the supply voltage. This device can be used to interface 5V to 3V systems and two supply systems such as battery back up. This circuit prevents device destruction due to mismatched supply and input voltages.
Note: xxxFN (JEDEC SOP) is not available in Japan. TC74LVX00F
TC74LVX00FN
Features
* * * * * * * High-speed: tpd = 4.1 ns (typ.) (VCC = 3.3 V) Low power dissipation: ICC = 2 A (max) (Ta = 25C) Input voltage level: VIL = 0.8 V (max) (VCC = 3 V) VIH = 2.0 V (min) (VCC = 3 V) Power-down protection provided on all inputs Balanced propagation delays: tpLH tpHL - Low noise: VOLP = 0.5 V (max) Pin and function compatible with 74HC00
TC74LVX00FT
Weight SOP14-P-300-1.27A SOL14-P-150-1.27 TSSOP14-P-0044-0.65A
: 0.18 g (typ.) : 0.12 g (typ.) : 0.06 g (typ.)
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TC74LVX00F/FN/FT
Pin Assignment (top view) IEC Logic Symbol
1A 1B 2A 2B 1Y 2A 2B 2Y GND 3 4 5 6 7 12 11 10 9 8 4A 4Y 3B 3A 3Y 3A 3B 4A 4B (1) (2) (4) (5) (9) (10) (12) (13) & (3) (6) (8) (11)
1A 1B
1 2
14 13
VCC 4B
1Y 2Y 3Y 4Y
Truth Table
Input A L L H H B L H L H Output Y H H H L
Absolute Maximum Ratings (Note)
Characteristics Supply voltage range DC input voltage DC output voltage Input diode current Output diode current DC output current DC VCC/ground current Power dissipation Storage temperature Symbol VCC VIN VOUT IIK IOK IOUT ICC PD Tstg Rating -0.5 to 7.0 -0.5 to 7.0 -0.5 to VCC + 0.5 -20 20 25 50 180 -65 to 150 Unit V V V mA mA mA mA mW C
Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
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Operating Ranges (Note)
Characteristics Supply voltage Input voltage Output voltage Operating temperature Input rise and fall time Symbol VCC VIN VOUT Topr dt/dv Rating 2.0 to 3.6 0 to 5.5 0 to VCC -40 to 85 0 to 100 Unit V V V C ns/V
Note: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND.
Electrical Characteristics
DC Characteristics
Characteristics Symbol Test Condition VCC (V) 2.0 H-level Input voltage L-level VIL VIH 3.0 3.6 2.0 3.0 3.6 IOH = -50 A VIN = VIH IOH = -50 A or VIL IOH = -4 mA IOL = 50 A L-level VOL VIN = VIH IOL = 50 A IOL = 4 mA Input leakage current Quiescent supply current IIN ICC VIN = 5.5 V or GND VIN = VCC or GND 2.0 3.0 3.0 2.0 3.0 3.0 3.6 3.6 Min 1.5 2.0 2.4 1.9 2.9 2.58 Ta = 25C Typ. 2.0 3.0 0 0 Max 0.5 0.8 0.8 0.1 0.1 0.36 0.1 2.0 Ta = -40 to 85C Min 1.5 2.0 2.4 1.9 2.9 2.48 Max 0.5 0.8 0.8 0.1 0.1 0.44 1.0 20.0 A A V V Unit
H-level Output voltage
VOH
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AC Characteristics (input: tr = tf = 3 ns)
Characteristics Symbol Test Condition VCC (V) tpLH Propagation delay time tpHL tosLH tosHL CIN CPD 3.3 0.3 2.7 3.3 0.3 2.7 CL (pF) 15 50 15 50 50 50 (Note 2) (Note 3) Min Ta = 25C Typ. 5.4 7.9 4.1 6.6 4 19 Max 10.1 13.6 6.2 9.7 1.5 1.5 10 Ta = -40 to 85C Min 1.0 1.0 1.0 1.0 Max 12.5 16.0 7.5 11.0 1.5 1.5 10 ns pF pF ns Unit
Output to output skew Input capacitance Power dissipation capacitance
(Note 1)
Note 1: Parameter guaranteed by design. (tosLH = |tpLHm - tpLHn|, tosHL = |tpHLm - tpHLn|) Note 2: Parameter guaranteed by design. Note 3: CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption. Average operating current can be obtained by the equation: ICC (opr) = CPDVCCfIN + ICC/4 (per gate)
Noise Characteristics (Ta = 25C, input: tr = tf = 3 ns, CL = 50 pF)
Characteristics Quiet output maximum dynamic VOL Quiet output minimum dynamic VOL Minimum high level dynamic input voltage VIH Maximum low level dynamic input voltage VIL Symbol VOLP VOLV VIHD VILD Test Condition VCC (V) 3.3 3.3 3.3 3.3 Typ. 0.3 -0.3 Limit 0.5 -0.5 2.0 0.8 Unit V V V V
Input Equivalent Circuit
INPUT
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Package Dimensions
Weight: 0.18 g (typ.)
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Package Dimensions (Note)
Note:
This package is not available in Japan.
Weight: 0.12 g (typ.)
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TC74LVX00F/FN/FT
Package Dimensions
Weight: 0.06 g (typ.)
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RESTRICTIONS ON PRODUCT USE
* The information contained herein is subject to change without notice.
20070701-EN GENERAL
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
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